Name: EOS M Process Data Package
Brand: EOS Store
Price: 4140.0 EUR
Availability: InStock

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EOS M Process Data packages offer metal material and process qualification data created during the development of our process products. The data includes location-specific data quantifying the typical variation of the printed part properties within a build job across the build platform area.

Main Use Cases of EOS M Process Data Package :

Analyze the capability of the AM solution (system, powder, and process combination) to produce consistent part properties and save time by not having to build all the test components from scratch.
Use the mechanical raw data of the data package to create optimal design for components produced with AM technology.
Choose the optimal material, process and system combination for your application by comparing the performance of different materials and processes across EOS M system types.
Speed up the qualification of your part production process on a given system-process-material combination.
Speed up initial AM technology performance evaluation, to smoothen the decision to enter AM.

Product Information:

The data packages consist of extensive validation raw data of the mechanical properties and the metallurgical quality of the produced parts:

Tensile data with orientation and location information across the build platform
Defect analyses with spatial information across the build platform
150 – 450 data points in total, depending on material-system- process combination. The higher the Technology readiness level (TRL) is, the more there is data.

View the table below to know the available dataset for different material-system- process combination.

Product Format:

This data package is delivered in MS Excel file format with basic analytics & plots included. Read the disclaimer for more information.

EOS M-System		EOS M 290	EOS M 290	EOS M 290	EOS M 290
Materials		EOS Alumium AlSi10Mg	EOS Nickel-Alloy IN718	EOS ToolSteel 1.2709	EOS Titanium TiCP
Layer Thickness (µm)		30	40	40	30
Tensile as-manufactured Samples	Vertical	123	41	42	21
Tensile as-manufactured Samples	Horizontal	96	36	36	18
Tensile Heat Treated Samples	Vertical	42	42	188	21
Tensile Heat Treated Samples	Horizontal	36	36	162	18
Sum of Tensile Samples		297	155	428	78
Tensile Sample Positions		8/9	8/9	8/9	8/9
Defect Analysis Samples		20	20	55	90
Defect Analysis Sample Positions		5/9	5/9	5/9	5/9

EOS M-System		EOS M 290	EOS M 290	EOS M 290
Materials		EOS Titanium Ti64	EOS Titanium Ti64 Grade5	EOS Titanium Ti64 Grade23
Layer Thickness (µm)		60	40	40
Tensile as-manufactured Samples	Vertical	63	42	42
Tensile as-manufactured Samples	Horizontal	54	36	36
Tensile Heat Treated Samples	Vertical	63	84	84
Tensile Heat Treated Samples	Horizontal	54	72	72
Sum of Tensile Samples		234	234	234
Tensile Sample Positions		8/9	8/9	8/9
Defect Analysis Samples		20	30	30
Defect Analysis Sample Positions		5/9	5/9	5/9

EOS M-System		EOS M 400	EOS M 400
Materials		EOS NickelAlloy IN718	EOS Titanium Ti64
Layer Thickness (µm)		40	30
Tensile as-manufactured Samples	Vertical	42	69
Tensile as-manufactured Samples	Horizontal	42	69
Tensile Heat Treated Samples	Vertical	42	42
Tensile Heat Treated Samples	Horizontal	42	41
Sum of Tensile Samples		168	221
Tensile Sample Positions		9/9	9/9
Defect Analysis Samples		20	5
Defect Analysis Sample Positions		5/9	5/9

EOS M-System		EOS M 400-4	EOS M 400-4	EOS M 400-4	EOS M 400-4
Metal Materials		EOS Alumium AlSi10Mg	EOS Nickel-Alloy IN718	EOS Titanium Ti64	EOS Titanium TiCP
Layer Thickness (µm)		40	40	60	30
Tensile as-manufactured Samples	Vertical	94	0	0	0
Tensile as-manufactured Samples	Horizontal	73	0	0	0
Tensile Heat Treated Samples	Vertical	14	120	120	119
Tensile Heat Treated Samples	Horizontal	14	95	96	95
Sum of Tensile Samples		195	215	216	214
Tensile Sample Positions		9/9	16/16	16/16	16/16
Defect Analysis Samples		19	0	40	40
Defect Analysis Sample Positions		5/9	0/9	16/16	16/16

By purchasing the Data Package the users acquire information about measurements results obtained by the interaction of EOS system, EOS powder and EOS process for their exclusive and unrestricted use.

The content of this Data Package is provided for information purposes only and EOS makes no representation or warranty, and disclaims any liability, with respect to the measurement results achieved. Measurement results are dependent on a variety of influencing factors and therefore, actual results achieved by the user may deviate from the information stated in the Data Package.

This document does not on its own represent a sufficient basis for any part design, neither does it provide any agreement or guarantee about the specific properties of EOS Systems, system settings, a material or part or the suitability of a material or a part for a specific application.
The achievement of certain part properties as well as the assessment of the suitability of this material for a specific purpose is the sole responsibility of the user.

Furthermore, the user is prohibited from disclosing information from this Data Package to third parties and refrain from any form of publication. In the event of unauthorized disclosure, EOS reserves the right to take legal action against the user.

EOS M Process Data Package

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