EOS M Process Data Package

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This data package is delivered in MS Excel file format.

System: EOS M 290
Material: EOS ToolSteel 1.2709
Layer Thickness: 40 µm
Price:
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Description

EOS M-System 

EOS M 290 

EOS M 290 EOS M 290 EOS M 290
Materials 

EOS Alumium AlSi10Mg 

EOS Nickel-Alloy IN718 

EOS ToolSteel 1.2709 

EOS Titanium TiCP 

Layer Thickness (µm) 30  40  40  30 
Tensile as-manufactured Samples  Vertical  123  41  42 21 
Horizontal  96  36  36 18
Tensile Heat Treated Samples  Vertical  42  42  188  21
Horizontal  36 36  162 18
Sum of Tensile Samples  297 155 428 78 
Tensile Sample Positions  8/9  8/9  8/9  8/9 
Defect Analysis Samples  20  20  55  90 
Defect Analysis Sample Positions  5/9  5/9  5/9  5/9 

 

EOS M-System 

EOS M 290 

EOS M 290 EOS M 290
Materials 

EOS Titanium Ti64  

EOS Titanium Ti64 Grade5 

EOS Titanium Ti64 Grade23

Layer Thickness (µm) 60  40  40 
Tensile as-manufactured Samples  Vertical  63  42  42
Horizontal  54  36  36
Tensile Heat Treated Samples  Vertical  63 84  84 
Horizontal  54 72  72 
Sum of Tensile Samples  234 234 234
Tensile Sample Positions  8/9  8/9  8/9 
Defect Analysis Samples  20  30  30 
Defect Analysis Sample Positions  5/9  5/9  5/9 

EOS M-System  EOS M 400  EOS M 400 
Materials  EOS NickelAlloy IN718  EOS Titanium Ti64 
Layer Thickness (µm) 40  30 
Tensile as-manufactured Samples  Vertical  42  69 
Horizontal  42  69 
Tensile Heat Treated Samples  Vertical  42  42 
Horizontal  42  41 
Sum of Tensile Samples  168  221 
Tensile Sample Positions  9/9  9/9 
Defect Analysis Samples  20 
Defect Analysis Sample Positions  5/9  5/9 

EOS M-System 

EOS M 400-4 

EOS M 400-4 EOS M 400-4  EOS M 400-4 
Metal Materials 

EOS Alumium AlSi10Mg 

EOS Nickel-Alloy IN718 

EOS Titanium Ti64 

EOS Titanium TiCP 

Layer Thickness (µm) 40  40  60  30 
Tensile as-manufactured Samples  Vertical  94 
Horizontal  73 
Tensile Heat Treated Samples  Vertical  14  120  120  119 
Horizontal  14  95  96  95 
Sum of Tensile Samples  195  215  216  214 
Tensile Sample Positions  9/9  16/16  16/16  16/16 
Defect Analysis Samples  19  40  40 
Defect Analysis Sample Positions  5/9  0/9  16/16  16/16 

By purchasing the Data Package the users acquire information about measurements results obtained by the interaction of EOS system, EOS powder and EOS process for their exclusive and unrestricted use.


The content of this Data Package is provided for information purposes only and EOS makes no representation or warranty, and disclaims any liability, with respect to the measurement results achieved. Measurement results are dependent on a variety of influencing factors and therefore, actual results achieved by the user may deviate from the information stated in the Data Package.


This document does not on its own represent a sufficient basis for any part design, neither does it provide any agreement or guarantee about the specific properties of EOS Systems, system settings, a material or part or the suitability of a material or a part for a specific application.
The achievement of certain part properties as well as the assessment of the suitability of this material for a specific purpose is the sole responsibility of the user.


Furthermore, the user is prohibited from disclosing information from this Data Package to third parties and refrain from any form of publication. In the event of unauthorized disclosure, EOS reserves the right to take legal action against the user.

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